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Volumn 155, Issue 1-2, 2006, Pages 125-128

Accurate determination of trace amounts of oxygen in CrAlN hard coatings by a combination of WDS-EPMA and SIMS

Author keywords

EPMA; Hard coating; Light elements; Oxygen quantification; SIMS

Indexed keywords


EID: 33748553726     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0529-6     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 2
    • 33748537674 scopus 로고    scopus 로고
    • Hard film and hard film coated tool. Hitachi Tool Engineering Ltd., Narita-shi Chiba-ken, Japan. EP 1 422 311 A3, Patent
    • Ishikawa T (2004) Hard film and hard film coated tool. Hitachi Tool Engineering Ltd., Narita-shi Chiba-ken, Japan. EP 1 422 311 A3, Patent
    • (2004)
    • Ishikawa, T.1
  • 5
    • 0002003383 scopus 로고
    • Nonconductive specimens in the electron probe microanalyzer - A hitherto poorly discussed problem
    • Heinrich F J, Newbury D E (eds) New York, N. Y. Conference
    • Bastin G F, Heijligers H J M (1991) Nonconductive specimens in the electron probe microanalyzer - a hitherto poorly discussed problem. In: Heinrich F J, Newbury D E (eds) Electron Probe Quant. Plenum, New York, N. Y. Conference, pp 163-175
    • (1991) Electron Probe Quant. Plenum , pp. 163-175
    • Bastin, G.F.1    Heijligers, H.J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.