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Volumn 110, Issue 32, 2006, Pages 15724-15728

High-density, aligned SiO2 nanowire arrays: Microscopic imaging of the unique growth style and their ultraviolet light emission properties

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; IMAGE ANALYSIS; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; SILICA;

EID: 33748533472     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0622233     Document Type: Article
Times cited : (33)

References (38)
  • 27


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.