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Volumn 55, Issue 6, 2006, Pages 441-446

Measurment of incident beam angular dependence of X-ray luminescence intensity and possibility of new atom resolved holography

(6) Hayashi, Kouichi a Hayashi, Tetsutaro b Shishido, Toetsu a Matsubara, Eiichiro c Makino, Hisao d Yao, Takafumi b

a TOHOKU UNIVERSITY (Japan)

b TOHOKU UNIVERSITY (Japan)

c KYOTO UNIVERSITY (Japan)

d KOCHI UNIVERSITY OF TECHNOLOGY (Japan)

Author keywords

Local structure; Sapphire; X ray excited optical luminescence; X ray fluorescence holography; X ray luminescence; ZnO

Indexed keywords

EID: 33748531845 PISSN: 05251931 EISSN: 05251931 Source Type: Journal
DOI: 10.2116/bunsekikagaku.55.441 Document Type: Article

Times cited : (1)

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