Defect structure in (Zn,Mg)O films prepared on YSZ substrate

Key Engineering Materials

Volumn 320, Issue , 2006, Pages 103-106

  Ryoken, Haruki ^a,b   Sakaguchi, Isao ^a   Ohashi, Naoki ^a   Adachi, Yutaka ^a   Ohgaki, Takeshi ^a   Hishita, Shunichi ^a   Haneda, Hajime ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Pulsed laser deposition (PLD); Secondary ion mass spectroscopy (SIMS); Solid solubility limit; Zinc oxide

Indexed keywords

CRYSTAL DEFECTS; DIFFUSION; HEAT TREATMENT; PULSED LASER DEPOSITION; SECONDARY ION MASS SPECTROMETRY; SOLID SOLUTIONS; SUBSTRATES; YTTRIUM COMPOUNDS;

OXYGEN DIFFUSIVITY; SOLID SOLUBILITY LIMIT; SOLID SOLUTION FILMS; WURTZITE;

THIN FILMS;

EID: 33748443600     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-411-1.103     Document Type: Conference Paper

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