Surface characterization of functional nanostructures sputtered on fiber substrates

Surface and Coatings Technology

Volumn 201, Issue 3-4, 2006, Pages 1821-1826

  Wei, Qufu ^a   Li, Qi ^a   Hou, Dayin ^b   Yang, Zhiting ^a   Gao, Weidong ^a  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b ANHUI POLYTECHNIC UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Conductivity; Nanostructure; Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; FIBERS; MORPHOLOGY; POLYMERS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES;

FIBER SUBSTRATES; FUNCTIONAL NANOSTRUCTURES; SURFACE CHARACTERIZATION;

NANOSTRUCTURED MATERIALS;

ATOMIC FORCE MICROSCOPY; COPPER; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; FIBERS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POLYMERS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES;

EID: 33748431066     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.03.007     Document Type: Article

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