Comparing two measurement techniques for high frequency characterization of power cable semiconducting and insulating materials

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 4, 2006, Pages 712-716

  Mugala, Gavita ^a   Eriksson, Roland ^a   Pettersson, Per ^b  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b RINGHALS AB   (Sweden)

Author keywords

Characterization; Complex permittivity; High frequency; Insulation; Measurements; One port; Scattering parameters; Semiconducting; Two port

Indexed keywords

CHARACTERIZATION; ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC INSULATING MATERIALS; ELECTROMAGNETIC WAVE PROPAGATION; NATURAL FREQUENCIES; POLYETHYLENES; SCATTERING PARAMETERS; SEMICONDUCTOR MATERIALS;

COMPLEX PERMITTIVITY; HIGH FREQUENCY; ONE-PORT; TWO-PORT;

ELECTRIC CABLES;

EID: 33748323309     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1667728     Document Type: Article

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