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Volumn 20, Issue 17, 2006, Pages 2596-2602

Electrospray droplet impact/secondary ion mass spectrometry: Cluster ion formation

Author keywords

[No Author keywords available]

Indexed keywords

DROPS; ELECTROSPRAY IONIZATION; IMPACT IONIZATION; KINETIC ENERGY; KINETICS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SHOCK WAVES;

EID: 33748249841     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.2633     Document Type: Article
Times cited : (38)

References (17)
  • 5
    • 85159257379 scopus 로고    scopus 로고
    • NIST Mass Spectrometry Data Center, Collection; (C) 2002 copyright by the U.S. Secretary of Commerce, on behalf of the United States of America
    • NIST Mass Spectrometry Data Center, Collection; (C) 2002 copyright by the U.S. Secretary of Commerce, on behalf of the United States of America.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.