SIMS study of deuterium distribution in chemically charged aluminum containing oxide layer defects and trapping sites

Journal of Alloys and Compounds

Volumn 415, Issue 1-2, 2006, Pages 134-142

  Rozenak, P ^a   Ladna, B ^a   Birnbaum, H K ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Aluminum; Chemical charging; Defects; Hydrogen; Traps

Indexed keywords

ALUMINUM; DEUTERIUM; DIFFUSION; DISLOCATIONS (CRYSTALS); ELECTRIC CHARGE; HIGH TEMPERATURE EFFECTS; HYDRATED ALUMINA; HYDROGENATION; INORGANIC ACIDS; MICROSTRUCTURE; SECONDARY ION MASS SPECTROMETRY; SODIUM COMPOUNDS;

CHEMICAL CHARGING; OXIDE LAYER; TRAPPING SITE; TRAPS;

SINGLE CRYSTALS;

EID: 33748162679     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.08.031     Document Type: Article

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