Characterization of H defects in the aluminium-hydrogen system using small-angle scattering techniques

Journal of Applied Crystallography

Volumn 34, Issue 2, 2001, Pages 119-129

  Buckley, C E ^a   Birnbaum, H K ^b   Lin, J S ^c   Spooner, S ^c   Bellmann, D ^d   Staron, P ^d   Udovic, T J ^e   Hollar, E ^b  

^a CURTIN UNIVERSITY   (Australia)

^b University of Illinois at Urbana Champaign   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d INSTITUTE OF MATERIALS RESEARCH   (Germany)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; HYDROGEN;

ALUMINUM FOIL; ANALYTIC METHOD; ARTICLE; CRYSTAL; MEASUREMENT; NEUTRON SCATTERING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 0035070778     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800018239     Document Type: Article

References (12)

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