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Volumn 445-448, Issue 1-2, 2006, Pages 141-145
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Film thickness dependence of critical current characteristics of YBCO-coated conductors
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Author keywords
Critical current density; Flux creep flow model; Irreversibility field; n value; Superconducting layer thickness; YBCO coated conductor
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Indexed keywords
COATINGS;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
LAYERED MANUFACTURING;
YTTRIUM COMPOUNDS;
FLUX CREEP;
FLUX CREEP FLOW MODEL;
IRREVERSIBILITY FIELD;
N-VALUE;
PINNING;
SUPERCONDUCTING LAYER THICKNESS;
ELECTRIC CONDUCTORS;
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EID: 33748156617
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physc.2006.03.102 Document Type: Article |
Times cited : (9)
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References (8)
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