Thickness dependence of pinning properties in Bi-2212 superconductor

Superconductor Science and Technology

Volumn 18, Issue 10, 2005, Pages 1348-1353

  Matsushita, Teruo ^a   Kiuchi, Masaru ^a   Yasuda, Takashi ^a   Wada, Hiroshi ^a   Uchiyama, Tetsuji ^b   Iguchi, Ienari ^b  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ENERGY DISSIPATION; MAGNETIC FLUX; SINGLE CRYSTALS; SUPERCONDUCTING MATERIALS; THIN FILMS;

BI-2212; FLUX LINES; INTERLAYER COUPLING LENGTH; PINNING CORRELATION;

BISMUTH;

EID: 25144508536     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/10/017     Document Type: Article

References (20)

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