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Volumn E89-C, Issue 7, 2006, Pages 1042-1046

Temperature and illumination dependence of AlGaN/GaN HFET threshold voltage

Author keywords

AlGaN GaN HFETs; Buffer layer; Illumination; Temperature coefficient; Threshold voltage

Indexed keywords

BUFFER CIRCUITS; CARRIER CONCENTRATION; GALLIUM NITRIDE; LIGHTING; SEMICONDUCTING ALUMINUM COMPOUNDS; THERMAL EFFECTS; THRESHOLD VOLTAGE;

EID: 33747891099     PISSN: 09168524     EISSN: 17451353     Source Type: Journal    
DOI: 10.1093/ietele/e89-c.7.1042     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 1
    • 0035279282 scopus 로고    scopus 로고
    • Gallium nitride based high power heterojunction field effect transistor: Process development and present status at UCSB
    • S. Keller, Y.-F. Wu, G. Parish, N. Ziang, J.J. Xu, B.P. Keller, S.P. DenBaars, and U.K. Mishra, "Gallium nitride based high power heterojunction field effect transistor: Process development and present status at UCSB," IEEE Trans. Electron Devices, vol.48, no.3, pp.552-559, 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.3 , pp. 552-559
    • Keller, S.1    Wu, Y.-F.2    Parish, G.3    Ziang, N.4    Xu, J.J.5    Keller, B.P.6    DenBaars, S.P.7    Mishra, U.K.8
  • 2
    • 0030242727 scopus 로고    scopus 로고
    • A large-signal equivalent circuit for substrate-induced drain-lag phenomena in HJFET's
    • K. Kunihiro and Y. Ohno, "A large-signal equivalent circuit for substrate-induced drain-lag phenomena in HJFET's," IEEE Trans. Electron Devices, vol.43, no.9, pp. 1336-1342, 1996.
    • (1996) IEEE Trans. Electron Devices , vol.43 , Issue.9 , pp. 1336-1342
    • Kunihiro, K.1    Ohno, Y.2
  • 4
    • 0020087768 scopus 로고
    • DS characteristics model based on a point charge and its mirror images
    • DS characteristics model based on a point charge and its mirror images," IEEE Trans. Electron Devices, vol.ED-29, no.2, pp.211-216, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , Issue.2 , pp. 211-216
    • Ohno, Y.1
  • 5
    • 21244498437 scopus 로고
    • Temperature dependence of n-type MOS transistors
    • F.P. Heiman and H.S. Miller, "Temperature dependence of n-type MOS transistors," IEEE Trans. Electron Devices, vol.ED-12, no.3, pp.142-148, 1965.
    • (1965) IEEE Trans. Electron Devices , vol.ED-12 , Issue.3 , pp. 142-148
    • Heiman, F.P.1    Miller, H.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.