Visual characterization of paper using isomap and local binary patterns

IEICE Transactions on Information and Systems

Volumn E89-D, Issue 7, 2006, Pages 2076-2083

  Turtinen, Markus ^a   Pietikäinen, Matti ^a   Silvén, Olli ^a  

^a UNIVERSITY OF OULU   (Finland)

Author keywords

Paper inspection; Texture analysis; Visualization

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; FEATURE EXTRACTION; MATHEMATICAL MODELS; PATTERN MATCHING; SURFACE PROPERTIES;

BINARY PATTERNS; IMAGE VISUALIZATION; ISOMETRIC FEATURE MAPPING (ISOMAP); PAPER INSPECTION; TEXTURE ANALYSIS;

IMAGE ANALYSIS;

EID: 33747878618     PISSN: 09168532     EISSN: 17451361     Source Type: Journal    
DOI: 10.1093/ietisy/e89-d.7.2076     Document Type: Conference Paper

References (18)

1. M. Tuceryan and A. Jain, "Texture analysis," in Handbook of Pattern Recognition and Computer Vision, 2nd ed., ed. C. Chen, L. Pau, and P. Wang, pp.207-248, World Scientific, Singapore, 1999.
2. J. Iivarinen and J. Rauhamaa, "Surface inspection of web materials using the self-organizing map," in Intelligent Robots and Computer Vision XVII: Algorithms, Techniques, and Active Vision, pp.96-103, 1998.
3. T. Cresson and P. Luner, "Characterization of paper formation, part 2: The texture analysis of paper formation," Tappi Journal, vol.73, no. 12, pp.175-184, 1990.
4. M. Bouyndain, J. Colom, R. Navarro, and J. Pladellorens, "Determination of paper formation by fourier analysis of light transmission images," Appita J., vol.54, no.2, pp. 103-105, 115, 2001.
5. T. Randen and J. Husoy, "Filtering for texture classification: A comparative study," IEEE Trans. Pattern Anal. Mach. Intell., vol.21, no.4,pp.291-310,Feb. 1999.
6. T. Ojala, M. Pietikäinen, and T. Mäenpää, "Multiresolution grayscale and rotation invariant texture classification with local binary patterns," IEEE Trans. Pattern Anal. Mach. Intell., vol.24, no.7, pp.971-987, 2002.
7. M. Turtinen, M. Pietikäinen, O. Silvén, T. Mäenpää, and M. Niskanen, "Paper characterization by texture using visualization-based training," Int. J. Advanced Manufacturing Technology, vol.22, no.10-11,pp.890-898,2003.
8. T. Kohonen, Self-organizing Maps, Springer-Verlag, Berlin, Germany, 1997.
9. J. Tenenbaum, V. de Silva, and J. Langford, "A global geometric framework for nonlinear dimensionality reduction," Science, vol.290, pp.2319-2323, Dec. 2000.
10. D.S. Keller, J. Lewalle, and P. Luner, "Wavelet analysis of simulated paper formation," Paperi ja Puu, vol.1999, no.7, pp.499-505, 1999.
11. B. Jordan and N. Nguyen, "Specific perimeter - A graininess parameter for formation and print-mottle textures," Paperi ja Puu, vol.6, no.7, pp.476-482, 1986.
12. T. Cox and M. Cox, Multidimensional Scaling, Chapman and Hall, London, 1994.
13. V. de Silva and J. Tenenbaum, "Global versus local methods in nonlinear dimensionality reduction," Neural Information Processing Systems 15 (NIPS'2002), pp.705-712, 2002.
14. M. Bernstein, V. de Silva, J. Langford, and J. Tenenbaum, "Graph approximations to geodesies on embedded manifolds," Technical Report, Department of Psychology, Stanford University, USA, 2000. Available at http://isomap.stanford.edu/BdSLT.pdf
15. M. Balasubramanian, E. Schwartz, J. Tenenbaum, V. de Silva, and J. Langford, "The isomap algorithm and topological stability," Science, vol.295, p.7a, 2002. Technical Comments.
16. O. Kouropteva, O. Okun, and M. Pietikäinen, "Data visualization with multiple machine learning methods," Fourth IASTED International Conference on Visualization, Imaging, and Image Processing, pp. 190-196, 2004.
17. S.T. Roweis and L.K. Saul, "Nonlinear dimensionality reduction by locally linear embedding," Science, vol.290, pp.2323-2326, Dec. 2000.
18. R. Moddemeijer, "On estimation of entropy and mutual information of continuous distributions," Signal Process., vol.16, no.3, pp.233-246, 1989.