Surface inspection of web materials using the self-organizing map

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3522, Issue , 1998, Pages 96-103

  Iivarinen, Jukka ^a   Rauhamaa, Juhani ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; INSPECTION;

DEFECT CLASSIFICATION; DEFECT DETECTION; SELF ORGANIZING MAPS (SOM); SURFACE INSPECTION;

COMPUTER VISION;

EID: 0032296666     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)