Quantitative study of Xanthosoma violaceum leaf surfaces using RIMAPS and variogram techniques

Microscopy Research and Technique

Volumn 69, Issue 8, 2006, Pages 684-688

  Favret, Eduardo A ^a,b   Fuentes, Néstor O ^b,c   Molina, Ana M ^a  

^a INSTITUTO NACIONAL DE TECNOLOGÍA AGROPECUARIA INTA   (Argentina)

^b UNIVERSIDAD NACIONAL DE SAN MARTÍN   (Argentina)

^c DEPARTAMENTO DE FÍSICA   (Argentina)

Author keywords

Digitized image; Leaves; Scanning electron microscope; Surface characterization

Indexed keywords

SCANNING ELECTRON MICROSCOPY; TOPOGRAPHY;

AVERAGED POWER SPECTRUMS; DIGITIZED IMAGES; LEAF; LEAF SURFACES; POWER VARIOGRAMS; QUANTITATIVE DESCRIPTION; ROTATED IMAGES; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS; SURFACE CHARACTERIZATION;

SURFACE TOPOGRAPHY;

ANALYTIC METHOD; ARTICLE; FOURIER TRANSFORMATION; NONHUMAN; PLANT LEAF; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; ROTATED IMAGE WITH MAXIMUM AVERAGED POWER SPECTRUM; SPECTROSCOPY; SURFACE PROPERTY; TOPOGRAPHY; XANTHOSOMA; XANTHOSOMA VIOLACEUM;

XANTHOSOMA VIOLACEUM;

EID: 33747874393     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20343     Document Type: Article

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