Distribution of oxygen vacancies and gadolinium dopants in ZrO2-CeO2 multi-layer films grown on α-Al2O3

Solid State Ionics

Volumn 177, Issue 15-16, 2006, Pages 1299-1306

  Wang, C M ^a   Engelhard, M H ^a   Azad, S ^a   Saraf, L V ^a   McCready, D E ^a   Shutthanandan, V ^a   Yu, Z Q ^a,c   Thevuthasan, S ^a   Watanabe, M ^b   Williams, D B ^b  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b Lehigh University   (United States)

^c NANJING NORMAL UNIVERSITY   (China)

Author keywords

Defect distribution; Gd doped ZrO2 CeO2; HRTEM; Nano scale film

Indexed keywords

DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; GADOLINIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIA;

DEFECT DISTRIBUTION; GD DOPED ZRO2/CEO2; HRTEM; NANO SCALE FILM;

MULTILAYERS;

EID: 33747765836     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2006.05.036     Document Type: Article

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