Reference-free analysis of flash thermography data

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6205, Issue , 2006, Pages

  Shepard, Steven M ^a   Hou, Yulin ^a   Ahmed, Tasdiq ^a   Lhota, James R ^a  

^a THERMAL WAVE IMAGING INC   (United States)

Author keywords

Nondestructive; Reconstruction; Thermography

Indexed keywords

NONDESTRUCTIVE EXAMINATION; SENSITIVITY ANALYSIS; SIGNAL RECONSTRUCTION; SPURIOUS SIGNAL NOISE;

DATA SEQUENCE; PIXEL; REFERENCE-FREE EVALUATION; THERMOGRAPHIC SIGNAL RECONSTRUCTION (TSR);

THERMOGRAPHY (IMAGING);

EID: 33747651111     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.669396     Document Type: Conference Paper

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