Visualization of subsurface defects in composites using a focal plane array infrared camera

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3700, Issue , 1999, Pages 26-31

  Plotnikov, Yuri A ^a   Winfree, William P ^a  

^a NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COMPOSITE MATERIALS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; NONDESTRUCTIVE EXAMINATION; VISUALIZATION;

FOCAL PLANE ARRAY INFRARED CAMERA; SUBSURFACE DEFECTS;

THERMOGRAPHY (IMAGING);

EID: 0032635964     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)