On-wafer measurement of microstrip-based circuits with a broadband vialess transition

IEEE Transactions on Advanced Packaging

Volumn 29, Issue 3, 2006, Pages 654-659

  Zhu, Lin ^a,b   Melde, Kathleen L ^a  

^a University of Arizona   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Coplanar waveguide (CPW) to microstrip transition; Microstrip on wafer measurement; Multiline thru reflect line (ML TRL) calibration; Vialess

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; DESIGN; INSERTION LOSSES; OPTIMIZATION; WAVEGUIDE COUPLERS;

BROADBAND VIALESS TRANSITION; MICROSTRIP ON-WAFER MEASUREMENT; MICROSTRIP TRANSITION; MULTILINE THRU-REFLECT-LINE (ML-TRL) CALIBRATION;

WAVEGUIDES;

EID: 33747601388     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2006.875093     Document Type: Article

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