On-wafer measurement of microstrip-based MIMICs without via holes

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1399-1402

  Strauss, Georg ^a   Ehret, Peter ^a   Menzel, Wolfgang ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTROMAGNETIC FIELDS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MICROSTRIP DEVICES;

ELECTROMAGNETIC FIELD COUPLING; ON WAFER CALIBRATION; VIA HOLES;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0029698658     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)