-
7
-
-
1642444288
-
-
C. Tejel M. A. Ciriano B. E. Villarroya J. A. Lopez F. J. Lahoz L. A. Oro Angew. Chem., Int. Ed. 2003 42 530
-
(2003)
Angew. Chem., Int. Ed.
, vol.42
, pp. 530
-
-
Tejel, C.1
Ciriano, M.A.2
Villarroya, B.E.3
Lopez, J.A.4
Lahoz, F.J.5
Oro, L.A.6
-
16
-
-
23744465061
-
-
Springer Science and Business Media, Inc., New York
-
F. A. Cotton, C. A. Murillo and R. A. Walton, Multiple Bonds Between Metal Atoms, 3rd edn, Springer Science and Business Media, Inc., New York, 2005
-
(2005)
Multiple Bonds between Metal Atoms, 3rd Edn
-
-
Cotton, F.A.1
Murillo, C.A.2
Walton, R.A.3
-
27
-
-
33749090974
-
-
M. H. Chisholm F. A. Cotton L. M. Daniels K. Folting J. C. Huffman S. S. Iyer C. Lin A. M. Macintosh C. A. Murillo J. Chem. Soc., Dalton Trans. 1999 1387
-
(1999)
J. Chem. Soc., Dalton Trans.
, pp. 1387
-
-
Chisholm, M.H.1
Cotton, F.A.2
Daniels, L.M.3
Folting, K.4
Huffman, J.C.5
Iyer, S.S.6
Lin, C.7
MacIntosh, A.M.8
Murillo, C.A.9
-
38
-
-
0003428066
-
-
Siemens Analytical X-Ray Instruments Inc., Madison, WI 53719, USA
-
SAINT, Program for area detector absorption correction, Siemens Analytical X-Ray Instruments Inc., Madison, WI 53719, USA, 1994-1996
-
(1994)
SAINT, Program for Area Detector Absorption Correction
-
-
-
40
-
-
0004150157
-
-
Bruker AXS: Madison, WI
-
SHELXTL Package v. 6.10, Bruker AXS: Madison, WI, 2000
-
(2000)
SHELXTL Package V. 6.10
-
-
-
42
-
-
0004048804
-
-
University of Utrecht, Netherlands
-
L. Spek, (2001), PLATON, University of Utrecht, Netherlands
-
(2001)
PLATON
-
-
Spek, L.1
-
58
-
-
33747605855
-
-
note
-
3CN molecules were refined with anisotropic thermal parameters. CCDC reference numbers 604231-604236. For crystallographic data in CIF or other electronic format see DOI: 10.1039/b601463a
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-
-
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59
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33747586821
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note
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Bond distances: Re1-Re2 2.3211(7), Re1-Cl1 2.534(3), Re1-P1 2.431(4), Re1-P3 2.429(4), Re1-N1 2.095(11), Re1-N2 2.101(13), Re2-P2 2.435(4), Re2-P4 2.424(4), Re2-N3 2.105(12), Re2-N4 2.095(10), Re2-N5 2.385(12); Bond angles: Re2-Re1-Cl1 170.47(10), Re2-Re1-P1 89.57(8), Re2-Re1-P3 102.24(9), Re2-Re1-N1 90.6(3), Re2-Re1-N 297.4(3), Cl1-Re1-P1 86.44(13), Cl1-Re1-P3 86.65(12), Cl1-Re1-N1 81.2(3), Cl1-Re1-N2 86.1(3), P1-Re1-P3 93.50(13), P1-Re1-N1 95.4(4), P1-Re1-N2 172.0(3), P3-Re1-N1 164.4(3), P3-Re1-N2 88.8(3), N1-Re1-N2 80.7(5), Re1-Re2-P2 101.75(8), Re1-Re2-P4 88.97(9), Re1-Re2-N3 101.1(2), Re1-Re2-N4 94.3(2), Re1-Re2-N5 173.1(3), P2-Re2-P4 93.69(13), P2-Re2-N3 88.5(3), P2-Re2-N4 162.7(3), P2-Re2-N5 85.1(3), P4-Re2-N3 169.0(3), P4-Re2-N4 93.1(3), P4-Re2-N5 89.8(4), N3-Re2-N4 82.0(4), N3-Re2-N5 79.7(4), N4-Re2-N5 79.0(4)
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60
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0000539769
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-
J.-P. Collin A. Jouaiti J.-P. Sauvage W. C. Kaska M. A. McLoughlin N. L. Keder W. T. A. Harrison G. D. Stucky Inorg. Chem. 1990 29 2238
-
(1990)
Inorg. Chem.
, vol.29
, pp. 2238
-
-
Collin, J.-P.1
Jouaiti, A.2
Sauvage, J.-P.3
Kaska, W.C.4
McLoughlin, M.A.5
Keder, N.L.6
Harrison, W.T.A.7
Stucky, G.D.8
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