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Volumn 252, Issue 13 SPEC. ISS., 2006, Pages 4678-4684

Production of nanoparticles of different materials by means of ultrashort laser pulses

Author keywords

Nanoparticles; Ultrashort laser ablation

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; LASER ABLATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS;

EID: 33747423599     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.089     Document Type: Article
Times cited : (33)

References (15)
  • 10
    • 33747446084 scopus 로고    scopus 로고
    • SPIP™, Image Metrology, was used for processing the AFM images. A classical threshold segmentation method was used for isolated particles, while an advanced method, called watershed segmentation, was employed to detect particles inside aggregated film (see http://www.imagemet.com/WebHelp/spip.htm).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.