PLA-PMMA blends: A study by XPS and ToF-SIMS

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 6636-6639

  Cossement, D ^a   Gouttebaron, R ^a   Cornet, V ^a   Viville, P ^a   Hecq, M ^a   Lazzaroni, R ^a  

^a MATERIA NOVA RESEARCH CENTER   (Belgium)

Author keywords

PCA; PLA PMMA blends; PLS regression; Quantification; ToF SIMS; XPS

Indexed keywords

POLYMETHYL METHACRYLATES; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

PLA/PMMA BLENDS; PLS REGRESSION; QUANTIFICATION; TOF-SIMS;

POLYMER BLENDS;

EID: 33747404219     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.225     Document Type: Article

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