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Volumn 7, Issue 9, 1986, Pages 516-518

Double-heterojunction GaAlInAs/GaInAs bipolar transistor grown by molecular beam epitaxy

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EID: 33747294366     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/EDL.1986.26457     Document Type: Article
Times cited : (17)

References (12)
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  • 2
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    • GaAs/ (GaA1)As heterojunction bipolar transistors using a self-aligned substitutional emitter process
    • Jan.
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    • (1986) IEEE Electron Device Lett , vol.EDL-7 , pp. 8-10
    • Chang, M.F.1    Asbeck, P.M.2    Miller, D.L.3    Wang, K.C.4
  • 3
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    • High-gain AI48In52As/In53Ga48 As vertical n-p-n heterojunction bipolar transistor grown by molecular beam epitaxy
    • R. J. Malik, J. R. Hayes, F. Capasso, K. Alavi, and A. Y. Cho, “High-gain AI 48 In 52 As/In 53 Ga 48 As vertical n-p-n heterojunction bipolar transistor grown by molecular beam epitaxy,” IEEE Electron Device Lett., vol. EDL-4, pp. 383–385, 1983.
    • (1983) IEEE Electron Device Lett , vol.EDL-4 , pp. 383-385
    • Malik, R.J.1    Hayes, J.R.2    Capasso, F.3    Alavi, K.4    Cho, A.Y.5
  • 4
    • 0021453572 scopus 로고
    • Triple implant (In, Ga)As/InP n-p-n heterojunction bipolar transistor for integrated circuit applications
    • M. Chaudhury, K. Tabatabaie-Alavi, and C. G. Fonstad, “Triple implant (In,Ga)As/InP n-p-n heterojunction bipolar transistor for integrated circuit applications,” IEEE Electron Device Lett., vol. EDL-5, p. 251, 1984.
    • (1984) IEEE Electron Device Lett , vol.EDL-5 , pp. 251
    • Chaudhury, M.1    Tabatabaie-Alavi, K.2    Fonstad, C.G.3
  • 5
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    • Double heterojunction NpN for GaAlAs/ GaAs bipolar transistor
    • omxH. Beneking and L. M. Su, “Double heterojunction NpN for GaAlAs/ GaAs bipolar transistor,” Electron. Lett., vol. 18, p. 25, 1982.
    • (1982) Electron. Lett , vol.18 , pp. 25
    • Beneking, H.1    Su, L.M.2
  • 6
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    • GaAs/ (GaAl)As heterojunction bipolar transistors with buried oxygen-im-planted isolation layer
    • P. M. Asbeck, D. L. Miller, R. J. Andersen, and F. H. Eisen, “GaAs/ (GaAl)As heterojunction bipolar transistors with buried oxygen-im-planted isolation layer,” IEEE Electron Device Lett., vol. EDL-5, pp. 310–312, 1984.
    • (1984) IEEE Electron Device Lett , vol.EDL-5 , pp. 310-312
    • Asbeck, P.M.1    Miller, D.L.2    Andersen, R.J.3    Eisen, F.H.4
  • 7
    • 0022659211 scopus 로고    scopus 로고
    • Analysis of D.C. characteristics of GaA1As/GaAs double heterojunction bipolar transistors
    • D. Ankri, R. Azoulay, E. Caquot, J. Dangla, C. Dubon, and J. F. Palmier, “Analysis of D.C. characteristics of GaA1As/GaAs double heterojunction bipolar transistors,” Solid-State Electron., vol. 29, no. 2, pp. 141–149.
    • Solid-State Electron , vol.29 , Issue.2 , pp. 141-149
    • Ankri, D.1    Azoulay, R.2    Caquot, E.3    Dangla, J.4    Dubon, C.5    Palmier, J.F.6
  • 8
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    • N-p-n-N double heterojunction bipolar transistor on InGaAsP/InP
    • L. M. Su, N. G. Grote, R. Kaumanns, and H. Schroeter, “N-p-n-N double heterojunction bipolar transistor on InGaAsP/InP,” Appl. Phys. Lett., vol. 47, pp. 28–30, 1985.
    • (1985) Appl. Phys. Lett , vol.47 , pp. 28-30
    • Su, L.M.1    Grote, N.G.2    Kaumanns, R.3    Schroeter, H.4
  • 9
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    • Velocity field characteristics of minority carriers (electrons) in p-In53Ga47As
    • J. Degani, R. F. Leheny, R. E. Nahory, and J. P. Heritage, “Velocity field characteristics of minority carriers (electrons) in p-In 53 Ga 47 As,” Appl. Phys. Lett., vol. 39, pp. 569–572, 1981.
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  • 11
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    • Reproducible low-resistivity AuMn ohmic contact for p-type GaAs
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    • (1985) Electron. Lett , vol.21 , Issue.14 , pp. 614-615
    • Dubon-Chevalier, C.1    Duchenois, A.M.2    Bresse, J.F.3    Ankri, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.