Three-dimensional experimental analysis of the near-field and far-field radiation of planar millimeter-wave transmitters

Optics InfoBase Conference Papers

Volumn , Issue , 1997, Pages 196-201

  Pfeifer, T ^a   Loffler T ^a   Roskos, H G ^a   Kurz, H ^a   Strohm, K M ^b   Luy, J F ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b DAIMLER AG   (Germany)

Author keywords

Field imaging; Integrated millimeter wave circuits; Optoelectronics; Ultrafast measurements

Indexed keywords

PHOTOCONDUCTIVITY; TIMING CIRCUITS; TRANSMITTERS;

EXPERIMENTAL ANALYSIS; FAR-FIELD RADIATION; FIELD IMAGING; INTEGRATED MILLIMETER WAVE CIRCUIT; MILLIMETER WAVE CIRCUITS; MILLIMETRE WAVE TRANSMITTERS; NEAR FIELDS; NEAR-FAR; NEAR-FIELD DISTRIBUTION; ULTRAFAST MEASUREMENTS;

MILLIMETER WAVES;

EID: 33747223712     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. J.-F. Luy and P. Russer, Silicon-Based Millimeter-Wave Devices, W. Engl, ed. (Springer, Berlin, 1994).
2. A. Stiller, E. M. Biebl, J.-F. Luy, K. M. Strohm, and J. Buechler, "A Monolithic Integrated Millimeter Wave Transmitter for Automotive Applications", IEEE Trans. Microwave Theory Techn. 43, 1654 (1995).
3. M. Singer, A. Stiller, K. M. Strohm, J.-F. Luy, and E. M. Biebl, "A SIMMWIC 76 GHz Front-End with High Polarization Purity", Techn. Digest of IEEE MTT-S (San Fransisco, 1996), pp. 10791083.
4. T. Pfeifer, T. Löffler, H. G. Roskos, H. Kurz, M. Singer, and E. M. Biebl, " Electrooptic measurement of the electric near field distribution of a 7 GHz planar resonator", Electron. Lett. 32, 13051307 (1996).
5. T. Pfeifer, H.-M. Heiliger, T. Löffler, C. Ohlhoff, C. Meyer, G. Lüpke, H. G. Roskos, and H. Kurz, "Optoelectronic On-Chip Characterization of Ultrafast Electric Devices: Measurement Techniques and Applications", IEEE Journal Selected Topics of Quantum Electronics (April 1997 issue).
6. B. A. Nechay, A. S. Hou, and D. M. Bloom, "Picosecond Electrical Sampling with an Atomic Force Microscope", in Techn. Digest of Ultrafast Electronics and Optoelectronics, (OSA, Washington DC, 1997), pp. 181-183.
7. A. Leyk and E. Kubalek, "MMIC internal electric field mapping with submicrometre spatial resolution and gigahertz bandwidth by means of high frequency scanning force microscopy", Electron. Lett. 31, 2089-2091 (1995).
8. D. W. van der Weide, "Picosecond/nanometer resolution with a near-field microwave/scanning-force microscope", in Techn. Digest of Ultrafast Electronics and Optoelectronics, (OSA, Washington DC, 1997), pp. 178-180.
9. K. Takeuchi and A. Mizuhara, "Low-temperature grown GaAs probe for ultrafast electrical signal measurement", Electron. Lett. 33, 325-326 (1997).
10. M. Y. Frankel, J. F. Whitaker, and G. A. Mourou, " Optoelectronic Transient Characterization of Ultrafast Devices", IEEE Journ. Quantum Electron. 28, 2313-2324 (1992).
11. EO transducers are commercially available from: Terametrics, 1516 Fenway Road, Crofton, MD, 21114 USA.
12. T. Löffler, T. Pfeifer, H. G. Roskos, and H. Kurz, " Detection of Free-Running Electric Signals Up to 75 GHz Using a Femtosecond-Pulse Laser", IEEE Photon. Techn. Lett. 7, 1189-1191 (1995).
13. T. Pfeifer, T. Löffler, H. G. Roskos, H. Kurz, M. Singer, and E. M. Biebl, " Electro-optic near-field mapping of planar resonators", submitted to IEEE Trans. Antenna Prop., July 1996.
14. T. Löffler, T. Pfeifer, H. G. Roskos, H. Kurz, and D. W. van der Weide, "Stable Optoelectronic Detection of Free-Running Microwave Signals with 150 GHz Bandwidth", Microelectronic Engineering 31, 397-408 (1996).