Applications of SIMS to cultural heritage studies

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7096-7101

  Adriaens, A ^a   Dowsett, M G ^b  

^a GHENT UNIVERSITY   (Belgium)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Cultural heritage; Depth profiling; Imaging; Inorganic materials; SIMS; Speciation

Indexed keywords

IMAGE ANALYSIS; INORGANIC COMPOUNDS; PIGMENTS;

CULTURAL HERITAGE; DEPTH PROFILING; SPECIATION;

SECONDARY ION MASS SPECTROMETRY;

EID: 33747201945     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.127     Document Type: Article

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