Interstellar dust laser explorer (IDLE): A new instrument for submicron analyses of stardust-quantification of laser SNMS

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7117-7119

  Henkel, T ^a   Tizard, J ^a   Blagburn, D ^a   Lyon, I ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Laser ionization; Quantification; Secondary ionization; SIMS; SNMS; Stardust

Indexed keywords

DUST; EXCIMER LASERS; IONIZATION; LASER BEAM EFFECTS; OPTICAL RESOLVING POWER; PHOTONS; SPUTTERING;

INTERSTELLAR DUST LASER EXPLORER (IDLE); LASER IONIZATION; SECONDARY IONIZATION; STARDUST;

SECONDARY ION MASS SPECTROMETRY;

EID: 33747174283     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.139     Document Type: Article

References (13)

1. Braun R.M., et al. Rapid Commun. Mass Spectrom. 12 (1998) 1246-1252
2. Cliff B., et al. Rapid Commun. Mass Spectrom. 17 (2003) 2163-2167
3. Colliver T.L., et al. Anal. Chem. 69 13 (1997) 2225-2231
4. Tsou P., et al. J. Geophys. Res. 109 E12 (2004) S01
5. Koetter F.A., and Benninghoven A. In: Benninghoven A., Hagenhoff B., and Werner H.W. (Eds). Secondary Ion Mass Spectrometry SIMS vol. X (1997), John Wiley & Sons, Chichester 1011
6. Oechsner H., and Müller M. J. Vac. Sci. Technol. A 17 6 (1999) 3401-3405
7. Wucher A. In: Vickerman J.C., and Briggs D. (Eds). ToF-SIMS Surface Analysis by Mass Spectrometry (2001), IM Publications and Surface Spectra Limited, Chichester 347-373
8. Nicolussi G.K., et al. Science 277 (1997) 1281-1284
9. R. Hill, personal communication.
10. Wahl M., et al. Fresenius' J. Anal. Chem. 353 (1995) 354-359
11. Stephan T. Planet. Space Sci. 49 (2001) 859-906
12. Tizard, et al. Lunar and Planetary Science Conference, vol. XXXVI (2005) (#2115)
13. Tizard, et al., Meteorit. Planet. Sci., submitted for publication.