메뉴 건너뛰기




Volumn 252, Issue 19, 2006, Pages 6426-6428

Sputtering of clusters from nickel-aluminium

Author keywords

Laser SNMS; NiAl; Sputtering

Indexed keywords

NICKEL ALLOYS; PHOTOIONIZATION; RANDOM PROCESSES; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; SURFACE PHENOMENA;

EID: 33747161060     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.090     Document Type: Article
Times cited : (8)

References (23)
  • 12
    • 84949511665 scopus 로고    scopus 로고
    • Bond strengths in diatomic molecules
    • CRC Press, Boca Raton, FL pp. 9.51-9.63 (also NIST Chemistry Webbook, http://webbook.nist.gov/chemistry/)
    • Kerr J.A., and Stocker D.W. Bond strengths in diatomic molecules. Handbook of Chemistry and Physics. 81st ed. (2000-2001), CRC Press, Boca Raton, FL. http://webbook.nist.gov/chemistry/ pp. 9.51-9.63 (also NIST Chemistry Webbook, http://webbook.nist.gov/chemistry/)
    • (2000) Handbook of Chemistry and Physics. 81st ed.
    • Kerr, J.A.1    Stocker, D.W.2
  • 18
    • 33747172696 scopus 로고    scopus 로고
    • Vickerman J., and Briggs D. (Eds), Surface Spectra Ltd. and IM Publications
    • Wucher A. In: Vickerman J., and Briggs D. (Eds). TOF-SIMS: Surface Analysis by Mass Spectrometry (2001), Surface Spectra Ltd. and IM Publications 351
    • (2001) TOF-SIMS: Surface Analysis by Mass Spectrometry , pp. 351
    • Wucher, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.