Application of band-target entropy minimization (BTEM) and residual spectral analysis to in situ reflection-absorption infrared spectroscopy (RAIRS) data from surface chemistry studies

Analytica Chimica Acta

Volumn 571, Issue 1, 2006, Pages 113-120

  Kee, Boon Hong ^a   Sim, Wee Sun ^b   Chew, Wee ^a  

^a INSTITUTE OF CHEMICAL AND ENGINEERING SCIENCES   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Band target entropy minimization, BTEM; Chemometrics; In situ spectroscopy; Reflection absorption infrared spectroscopy; Self modeling curve resolution; Surface chemistry

Indexed keywords

CARBON MONOXIDE; ENTROPY; IN SITU PROCESSING; INFRARED SPECTROSCOPY; NICKEL COMPOUNDS; SPECTRUM ANALYSIS; SURFACE CHEMISTRY;

BAND-TARGET ENTROPY MINIMIZATION (BTEM); CHEMOMETRICS; IN SITU SPECTROSCOPY; REFLECTION-ABSORPTION INFRARED SPECTROSCOPY; SELF-MODELING CURVE RESOLUTION;

SINGLE CRYSTALS;

NICKEL;

ABSORPTION SPECTROSCOPY; ADSORPTION; ARTICLE; CORRELATION ANALYSIS; CRYSTAL; ENTROPY; INFRARED SPECTROSCOPY; KINETICS; NOISE; PRIORITY JOURNAL; VALIDITY;

EID: 33747133664     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2006.04.031     Document Type: Article

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