-
1
-
-
0344011430
-
-
Tobin J.G., Chung B.W., Schulze R.K., Terry J., Farr J.D., Shuh D.K., Heinzelman K., Rotenberg E., Waddill G.D., and van der Laan G. Phys. Rev. B 68 (2003) 155109
-
(2003)
Phys. Rev. B
, vol.68
, pp. 155109
-
-
Tobin, J.G.1
Chung, B.W.2
Schulze, R.K.3
Terry, J.4
Farr, J.D.5
Shuh, D.K.6
Heinzelman, K.7
Rotenberg, E.8
Waddill, G.D.9
van der Laan, G.10
-
2
-
-
33747073158
-
-
Los Alamos Sci., Issue 26, Challenges in Plutonium Science, 2000, many articles discussing the bonding character of the 5f electrons in Pu. Available from: .
-
-
-
-
3
-
-
33644959805
-
-
Tobin J.G., Moore K.T., Chung B.W., Wall M.A., Schwartz A.J., van der Laan G., and Kutepov A.L. Phys. Rev. B 72 (2005) 085109
-
(2005)
Phys. Rev. B
, vol.72
, pp. 085109
-
-
Tobin, J.G.1
Moore, K.T.2
Chung, B.W.3
Wall, M.A.4
Schwartz, A.J.5
van der Laan, G.6
Kutepov, A.L.7
-
4
-
-
1842427307
-
-
Trelenberg T.W., Glade S.C., Felter T.E., Tobin J.G., and Hamza A.V. Rev. Sci. Instrm. 75 3 (2004) 713
-
(2004)
Rev. Sci. Instrm.
, vol.75
, Issue.3
, pp. 713
-
-
Trelenberg, T.W.1
Glade, S.C.2
Felter, T.E.3
Tobin, J.G.4
Hamza, A.V.5
-
5
-
-
0003592140
-
-
Chrisey D.B., and Hubler G.K. (Eds), John Wiley & Sons, Inc., New York
-
In: Chrisey D.B., and Hubler G.K. (Eds). Pulsed Laser Deposition of Thin Films (1994), John Wiley & Sons, Inc., New York
-
(1994)
Pulsed Laser Deposition of Thin Films
-
-
-
6
-
-
33747032844
-
-
R.J. Tench, The nucleation and growth of uranium on the basal plane of graphite studied by scanning tunneling microscopy, Ph.D. thesis, University of California, Davis, report number: UCRL-LR-112417, 1992.
-
-
-
-
13
-
-
0030562982
-
-
Dam B., Rector H.J., Johansson J., Kars S., and Griessen R. Appl. Surf. Sci. 96-98 (1996) 679
-
(1996)
Appl. Surf. Sci.
, vol.96-98
, pp. 679
-
-
Dam, B.1
Rector, H.J.2
Johansson, J.3
Kars, S.4
Griessen, R.5
-
14
-
-
0345603135
-
-
Trelenberg T.W., Dinh L.N., Saw C.K., Stuart B.C., and Balooch M. Appl. Surf. Sci. 221 1-4 (2004) 364
-
(2004)
Appl. Surf. Sci.
, vol.221
, Issue.1-4
, pp. 364
-
-
Trelenberg, T.W.1
Dinh, L.N.2
Saw, C.K.3
Stuart, B.C.4
Balooch, M.5
-
15
-
-
0037106876
-
-
Dinh L.N., Hayes S.E., Wynne A.E., Wall M.A., Saw C.K., Stuart B.C., Balooch M., Paravastu A.K., and Reimer J.A. J. Mater. Sci. 37 (2002) 3953
-
(2002)
J. Mater. Sci.
, vol.37
, pp. 3953
-
-
Dinh, L.N.1
Hayes, S.E.2
Wynne, A.E.3
Wall, M.A.4
Saw, C.K.5
Stuart, B.C.6
Balooch, M.7
Paravastu, A.K.8
Reimer, J.A.9
-
17
-
-
85088191160
-
-
Glade S.C., Trelenberg T.W., Tobin J.G., Sterne P.A., and Hamza A.V. Mat. Res. Soc. Symp. Proc. 802 (2003) DD5.5.1
-
(2003)
Mat. Res. Soc. Symp. Proc.
, vol.802
-
-
Glade, S.C.1
Trelenberg, T.W.2
Tobin, J.G.3
Sterne, P.A.4
Hamza, A.V.5
-
19
-
-
0005040759
-
Electronic structure of solids: Photoemission spectra and related data
-
Goldmann A. (Ed), Springer-Verlag, Berlin
-
Goldmann A., Ishii T., Manzke R., Neagele J.R., and Skibowski M. Electronic structure of solids: Photoemission spectra and related data. In: Goldmann A. (Ed). Landolt Börnstein New Series III: Numerical Data and Functional Relationships in Science and Technology vol. 23B (1994), Springer-Verlag, Berlin
-
(1994)
Landolt Börnstein New Series III: Numerical Data and Functional Relationships in Science and Technology
, vol.23 B
-
-
Goldmann, A.1
Ishii, T.2
Manzke, R.3
Neagele, J.R.4
Skibowski, M.5
-
22
-
-
0001601273
-
-
Arko A.J., Joyce J.J., Morales L., Wills J., Lashley J., Wastin F., and Rebizant J. Phys. Rev. B 62 (2000) 1773
-
(2000)
Phys. Rev. B
, vol.62
, pp. 1773
-
-
Arko, A.J.1
Joyce, J.J.2
Morales, L.3
Wills, J.4
Lashley, J.5
Wastin, F.6
Rebizant, J.7
-
25
-
-
0003459529
-
-
Perkin-Elmer Corporation, Eden Praine pp. 1-29
-
Wagner C.D., Riggs W.M., Davis L.E., and Moulder J.F. Handbook of X-ray Photoelectron Spectroscopy (1979), Perkin-Elmer Corporation, Eden Praine pp. 1-29
-
(1979)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Wagner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Moulder, J.F.4
-
26
-
-
33747056870
-
-
NIST standard reference database 71: NIST electron inelastic mean fee path database, CD-ROM, Version 1.1, IMFP values determined from TPP-2M equation, a theoretical model. Surface Interface Anal. 21 (1994) 165. Available from: .
-
-
-
-
28
-
-
33144467614
-
-
Moore K.T., van der Laan G., Haire R.G., Wall M.A., and Schwartz A.J. Phys. Rev. B 73 (2006) 033109
-
(2006)
Phys. Rev. B
, vol.73
, pp. 033109
-
-
Moore, K.T.1
van der Laan, G.2
Haire, R.G.3
Wall, M.A.4
Schwartz, A.J.5
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