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Volumn 36, Issue 8, 2006, Pages 1542-1547

Where is the iron? Clinker microanalysis with XRD Rietveld, optical microscopy/point counting, Bogue and SEM-EDS techniques

Author keywords

Characterisation; Clinker; SEM EDX; X ray diffraction

Indexed keywords

CHARACTERIZATION; ENERGY DISPERSIVE SPECTROSCOPY; MICROANALYSIS; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33747063005     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cemconres.2006.05.031     Document Type: Article
Times cited : (49)

References (13)
  • 3
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    • Prediction of a Portland Cement's Properties from its Chemical and Mineralogical Composition
    • Skalny J.P., and Young J.F. (Eds), American Ceramic Society
    • Sorrentino D., Sorrentino F., and Gartner E.M. Prediction of a Portland Cement's Properties from its Chemical and Mineralogical Composition. In: Skalny J.P., and Young J.F. (Eds). Chapter 1 of "The Materials Science of Concrete, VII (2004), American Ceramic Society
    • (2004) Chapter 1 of "The Materials Science of Concrete, VII
    • Sorrentino, D.1    Sorrentino, F.2    Gartner, E.M.3
  • 8
    • 0038804444 scopus 로고    scopus 로고
    • Advances in quantitative XRD phase analysis of cement clinkers, part I: the answer to automation limits
    • 24th
    • Schmidt R., and Kern A. Advances in quantitative XRD phase analysis of cement clinkers, part I: the answer to automation limits. Proceedings of the International Conference on Cement Microscopy (2002) 275-285 24th
    • (2002) Proceedings of the International Conference on Cement Microscopy , pp. 275-285
    • Schmidt, R.1    Kern, A.2
  • 10
    • 0031651026 scopus 로고    scopus 로고
    • Automatic profile investigation by the Rietveld Method for standardless quantitative phase analysis
    • Möller H. Automatic profile investigation by the Rietveld Method for standardless quantitative phase analysis. ZKG International 1 (1998) 40-50
    • (1998) ZKG International , vol.1 , pp. 40-50
    • Möller, H.1
  • 11
    • 0038309679 scopus 로고    scopus 로고
    • Die quantitative Rietveld Phasenanalyse in industrieller Anwendung
    • Füllmann T., and Walenta G. Die quantitative Rietveld Phasenanalyse in industrieller Anwendung. ZKG International (May 2003)
    • (2003) ZKG International
    • Füllmann, T.1    Walenta, G.2
  • 12
    • 12144290907 scopus 로고    scopus 로고
    • Advances in quantitative XRD analysis for clinkers, cements and cementitious additions
    • Walenta G., and Füllmann T. Advances in quantitative XRD analysis for clinkers, cements and cementitious additions. Powder Diffraction Journal 19 1 (March 2004) 40-44
    • (2004) Powder Diffraction Journal , vol.19 , Issue.1 , pp. 40-44
    • Walenta, G.1    Füllmann, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.