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Volumn 19, Issue 1, 2004, Pages 40-44

Advances in quantitative XRD analysis for clinker, cements, and cementitious additions

Author keywords

[No Author keywords available]

Indexed keywords

CLINKERS; ONLINE MONITORING;

EID: 12144290907     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1649328     Document Type: Article
Times cited : (85)

References (15)
  • 1
    • 0020155245 scopus 로고
    • Accuracy and precision of an X-ray diffraction method for analysing Portland Cements
    • Aldrige, L. P. (1982). "Accuracy and precision of an X-ray diffraction method for analysing Portland Cements," Cem. Concr. Res. 12, 381-398.
    • (1982) Cem. Concr. Res. , vol.12 , pp. 381-398
    • Aldrige, L.P.1
  • 2
    • 0039106395 scopus 로고    scopus 로고
    • Quantitative Rietveld phase analysis of calcium aluminate cements
    • Füllmann, T., Walenta, G., Scrivener, K. L. et al. (1999), "Quantitative Rietveld phase analysis of calcium aluminate cements," World Cem. 6, 91-96.
    • (1999) World Cem. , vol.6 , pp. 91-96
    • Füllmann, T.1    Walenta, G.2    Scrivener, K.L.3
  • 4
    • 0021495227 scopus 로고
    • Quantitative X-ray powder diffraction in the study of some cementive materials
    • Edited by F.P. Glasser, British Ceramic Society U.K.
    • Gutteridge, W., "Quantitative X-ray powder diffraction in the study of some cementive materials," The Chemistry and Chemically Related Properties of Cement, edited by F. P. Glasser, British Ceramic Society, UK, 1984, pp. 11-23.
    • (1984) The Chemistry and Chemically Related Properties of Cement , pp. 11-23
    • Gutteridge, W.1
  • 5
    • 0039816306 scopus 로고
    • Least squares structure refinement based on powder film intensity data
    • Malmros, G. and Thomas, J. D. (1977). "Least squares structure refinement based on powder film intensity data," J. Appl. Crystallogr. 10, 107-111.
    • (1977) J. Appl. Crystallogr. , vol.10 , pp. 107-111
    • Malmros, G.1    Thomas, J.D.2
  • 6
    • 0002500354 scopus 로고    scopus 로고
    • XRD for on-line analysis and control
    • Manias, C., Retallack, D., Madsen, I. (2000). "XRD for on-line analysis and control," World Cem. 2, 78-81.
    • (2000) World Cem. , vol.2 , pp. 78-81
    • Manias, C.1    Retallack, D.2    Madsen, I.3
  • 7
    • 0029376452 scopus 로고
    • Standardless quantitative phase analysis of Portland cement clinkers
    • Möller, H. (1995), "Standardless quantitative phase analysis of Portland cement clinkers," World Cem. 9, 75-84.
    • (1995) World Cem. , vol.9 , pp. 75-84
    • Möller, H.1
  • 9
    • 0002211129 scopus 로고
    • A profile refinement method for nuclear and magnetic structures
    • Rietveld, H. M. (1969). "A profile refinement method for nuclear and magnetic structures," J. Appl. Crystallogr. 2, 65-71.
    • (1969) J. Appl. Crystallogr , vol.2 , pp. 65-71
    • Rietveld, H.M.1
  • 10
    • 0026382506 scopus 로고
    • Quantitative phase analysis of clinker using X-ray diffraction
    • Struble, L. J. (1991). "Quantitative phase analysis of clinker using X-ray diffraction," Cem. Concr. Aggreg. 2, 97-105.
    • (1991) Cem. Concr. Aggreg. , vol.2 , pp. 97-105
    • Struble, L.J.1
  • 11
    • 84974126408 scopus 로고
    • Full-profile Rietveld quantitative XRD analysis of Portland Cement: Standard XRD profiles for the major phase tricalcium silicate
    • Taylor, J. C. and Aldrige, L. P. (1993). "Full-profile Rietveld quantitative XRD analysis of Portland Cement: Standard XRD profiles for the major phase tricalcium silicate," Powder Diffr. 8, 138-144.
    • (1993) Powder Diffr. , vol.8 , pp. 138-144
    • Taylor, J.C.1    Aldrige, L.P.2
  • 12
    • 0002058407 scopus 로고    scopus 로고
    • Quantitative Rietveld analysis of cement and clinker
    • June
    • Walenta, G., Füllmann, T., Gimenez, M. et al. (2001). "Quantitative Rietveld analysis of cement and clinker," Int. Cement Rev. June, 51-54.
    • (2001) Int. Cement Rev. , pp. 51-54
    • Walenta, G.1    Füllmann, T.2    Gimenez, M.3
  • 14
    • 0001396302 scopus 로고
    • Application of the patter fitting structure refinement method to X-ray powder diffractometer pattern
    • Young, R. A., Mackie, D., and von Dreele, R. B. (1977). "Application of the patter fitting structure refinement method to X-ray powder diffractometer pattern," J. Appl. Crystallogr. 10, 262-269.
    • (1977) J. Appl. Crystallogr. , vol.10 , pp. 262-269
    • Young, R.A.1    Mackie, D.2    Von Dreele, R.B.3
  • 15
    • 0004326059 scopus 로고
    • Oxford University Press, Oxford
    • Young, R. A. (1993). The Rietveld Method (Oxford University Press, Oxford).
    • (1993) The Rietveld Method
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.