Physico-chemical characterisation of silicon carbide refractories

Journal of the European Ceramic Society

Volumn 26, Issue 15, 2006, Pages 3451-3458

  Gazulla, M F ^a   Gomez M P ^a   Orduna M ^a   Barba, A ^a  

^a INSTITUTO DE TECNOLOGÍA CERÁMICA   (Spain)

Author keywords

Composite refractories; Refractories; SiC; X ray methods

Indexed keywords

CHARACTERIZATION; COMPOSITE MATERIALS; COULOMETERS; EMISSION SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; SILICON CARBIDE; SPECTROMETRY; X RAY DIFFRACTION ANALYSIS;

COMPOSITE REFRACTORIES; INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY; WET METHOD; X-RAY FLUORESCENCE (XRF) SPECTROMETRY;

REFRACTORY MATERIALS;

CHARACTERIZATION; COMPOSITE MATERIALS; COULOMETERS; EMISSION SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; REFRACTORY MATERIALS; SILICON CARBIDE; SPECTROMETRY; X RAY DIFFRACTION ANALYSIS;

EID: 33747061592     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.08.009     Document Type: Article

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