메뉴 건너뛰기




Volumn 39, Issue 16, 2006, Pages 3702-3707

Dielectric behaviour of BaTiO3-based ceramic multilayer capacitors under high dc bias field

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; FERROELECTRIC CERAMICS; LOW TEMPERATURE EFFECTS; MULTILAYERS; PERMITTIVITY; RESIDUAL STRESSES; TEMPERATURE MEASUREMENT;

EID: 33746903574     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/16/027     Document Type: Article
Times cited : (41)

References (12)
  • 1
    • 0030835241 scopus 로고    scopus 로고
    • Dielectric temperature characteristics of cerium-modified barium titanate based ceramics with core-shell grain structure
    • Park Y and Kim H G 1997 Dielectric temperature characteristics of cerium-modified barium titanate based ceramics with core-shell grain structure J. Am. Ceram. Soc. 80 106-12
    • (1997) J. Am. Ceram. Soc. , vol.80 , pp. 106-112
    • Park, Y.1    Kim, H.G.2
  • 2
    • 0035324296 scopus 로고    scopus 로고
    • Microstructural investigations of barium titanate-based material for base metal electrode ceramic multilayer capacitor
    • Metzmacher C and Albertsen K 2001 Microstructural investigations of barium titanate-based material for base metal electrode ceramic multilayer capacitor J. Am. Ceram. Soc. 84 821-6
    • (2001) J. Am. Ceram. Soc. , vol.84 , Issue.4 , pp. 821-826
    • Metzmacher, C.1    Albertsen, K.2
  • 5
    • 0038343573 scopus 로고    scopus 로고
    • Base-metal electrode-multilayer ceramic capacitors: Past, present and future perspectives
    • Kishi H, Mizuno Y and Chazono H 2000 Base-metal electrode-multilayer ceramic capacitors: past, present and future perspectives Japan. J. Appl. Phys. 42 1-15
    • (2000) Japan. J. Appl. Phys. , vol.42 , pp. 1-15
    • Kishi, H.1    Mizuno, Y.2    Chazono, H.3
  • 6
    • 0035455045 scopus 로고    scopus 로고
    • DC-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedence analysis and microstructure
    • Hirokazo C and Hiroshi K 2001 DC-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: impedence analysis and microstructure Japan. J. Appl. Phys. 40 5624-9
    • (2001) Japan. J. Appl. Phys. , vol.40 , pp. 5624-5629
    • Hirokazo, C.1    Hiroshi, K.2
  • 7
    • 33645133806 scopus 로고    scopus 로고
    • Modeling of dielectric behaviors of multilayer ceramic capacitors under a direct current bias field
    • Wen H, Wang X H, Chen R Z and Li L T 2006 Modeling of dielectric behaviors of multilayer ceramic capacitors under a direct current bias field J. Am. Ceram. Soc. 89 550-6
    • (2006) J. Am. Ceram. Soc. , vol.89 , Issue.2 , pp. 550-556
    • Wen, H.1    Wang, X.H.2    Chen, R.Z.3    Li, L.T.4
  • 8
    • 0030262754 scopus 로고    scopus 로고
    • Dielectric response process in relaxor ferroelectrics
    • Gui H, Zhang X and Gu B 1996 Dielectric response process in relaxor ferroelectrics Appl. Phys. Lett. 69 2353-5
    • (1996) Appl. Phys. Lett. , vol.69 , Issue.16 , pp. 2353-2355
    • Gui, H.1    Zhang, X.2    Gu, B.3
  • 9
    • 1542397781 scopus 로고    scopus 로고
    • 3-based Ni-MLCCs with X7R characteristics
    • 3-based Ni-MLCCs with X7R characteristics J. Mater. Sci. 15 253-9
    • (2004) J. Mater. Sci. , vol.15 , pp. 253-259
    • Park, D.H.1    Jung, Y.G.2
  • 11
    • 15344338532 scopus 로고    scopus 로고
    • Investigation of useful or deleterious residual thermal Stress component to the capacitance of a multilayer ceramic capacitor
    • Shin H, Park J S, Kim S, Jung H S and Hong K S 2005 Investigation of useful or deleterious residual thermal Stress component to the capacitance of a multilayer ceramic capacitor Microelectron. Eng. 77 270-6
    • (2005) Microelectron. Eng. , vol.77 , Issue.3-4 , pp. 270-276
    • Shin, H.1    Park, J.S.2    Kim, S.3    Jung, H.S.4    Hong, K.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.