CdTe surface roughness by Raman spectroscopy using the 830 nm wavelength

Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

Volumn 65, Issue 1, 2006, Pages 51-55

  Frausto Reyes, C ^a   Molina Contreras, J Rafael ^b   Medina Gutierrez C ^c   Calixto, Sergio ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b INSTITUTO TECNOLÓGICO DE AGUASCALIENTES   (Mexico)

^c UNIVERSITY OF GUADALAJARA   (Mexico)

Author keywords

AFM; CdTe; Raman spectroscopy; Roughness

Indexed keywords

AFM; CADMIUM TELLURIDE; CDTE; SPECTRUM STRUCTURES;

ATOMIC FORCE MICROSCOPY; ELECTRIC EXCITATION; RAMAN SPECTROSCOPY; SURFACE ROUGHNESS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

CADMIUM COMPOUNDS;

CADMIUM DERIVATIVE; CADMIUM TELLURIDE; TELLURIUM;

ARTICLE; CHEMISTRY; EVALUATION; METHODOLOGY; RAMAN SPECTROMETRY; SURFACE PROPERTY;

CADMIUM COMPOUNDS; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; TELLURIUM;

EID: 33746875557     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2005.07.082     Document Type: Article

References (16)

1. Fritsche J., Schulmeyer T., Thißen A., Klein A., and Jaegermann W. Thin Solid Films 431-432 (2003) 267
2. Kaneta A., and Adachi S. J. Appl. Phys. 87 (2000) 7360
3. Lastras-Martínez A., Balderas-Navarro R.E., Cantú-Alejandro P., and Lastras-Martínez L.F. J. Appl. Phys. 86 (1999) 2062
4. Molina_C J.R., and Espinosa-Luna R. J. Phys. D: Appl. Phys. 38 (2005) 12
5. Ciulin V., Kossacki P., Haacke S., Ganiére J.D., Deveaud B., Esser A., Kutrowski M., and Wojtowicz T. Phys. Rev. B 62 (2000) 16310
6. Grann E., Chen Y., Tsen K.T., Ferry D.K., Almeida T., Chen Y.P., Faurie J.P., and Sivananthan S. J. Appl. Phys. 80 (1996) 3840
7. Santana-Aranda M.A., Luyo-Alvarado J., Meléndez-Lira M., Zapata-Torres M., Zapata-Navarro A., Jiménez-Sandoval S., Castro-Rodriguez R., and Peña J.L. Superficies y Vacio 8 (1999) 69
8. Sirenko A.A., Ruf T., Cardona M., Yakovlev D.R., Ossau W., Waag A., and Landwehr G. Phys. Rev. B 56 (1997) 2114
9. Palasantzas, and Hosson J.Th.M. J. Appl. Phys. 93 (2003) 320
10. Sánchez-Gil J.A., García-Ramos J.V., and Méndez E.R. Phys. Rev. B 62 (2000) 10515
11. Rusu M., Nicolaescu I.I., and Rusu G.G. Appl. Phys. 70 (2000) 565
12. Beckmann P., and Spizzichino A. Scattering of Electromagnetic Waves from Rough Surfaces (1963), Pergamon Press, Oxford
13. Huerta-Ruelas J., López-López M., and Zelaya-Ángel O. Jpn. J. Appl. Phys. 39 (2000) 1701
14. Drews D., Sham J., and Richter W. J. Appl. Phys. 78 (1995) 4060
15. Turrel G., Delhaye M., and Dhamelincourt P. In: Turrel G., and Corset J. (Eds). Raman Microscopy, Developments and Applications (1996), Academic Press, London pp. 27-49
16. Huerta J., López M., and Zelaya O. Superficies y Vacio 8 (1999) 125