Reflectometry measuring refractive index and thickness of polymer samples simultaneously

Journal of Modern Optics

Volumn 53, Issue 13, 2006, Pages 1845-1851

  Wang, Yi Ping ^a,b   Wang, Dong Ning ^a   Jin, Wei ^a   Chen, Jian Ping ^b   Li, Xin Wan ^b   Zhou, Jun He ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT ERRORS; MEASUREMENT THEORY; MIRRORS; OPTICAL FIBER FABRICATION; REFLECTOMETERS; REFRACTIVE INDEX;

CONTACTLESS MEASUREMENT TECHNIQUES; MEASUREMENT CONFIGURATION; MICHELSON INTERFERENCE SYSTEMS; POLYMER SAMPLES;

POLYMERS;

EID: 33746861461     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340600654764     Document Type: Article

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