메뉴 건너뛰기




Volumn 42, Issue 7, 2006, Pages 723-725

Microhardness and density of PbTe 1-xHal x (Hal = Cl, Br, I) solid solutions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33746858476     PISSN: 00201685     EISSN: 16083172     Source Type: Journal    
DOI: 10.1134/S0020168506070065     Document Type: Article
Times cited : (10)

References (9)
  • 6
    • 0000904750 scopus 로고
    • Self-compensation of Electrically Active Impurities by Native Defects in IV-VI Semiconductors
    • S.-Peterburg
    • Kaidanov, V.I., Nemov, S.A., and Ravich, Yu.I., Self-compensation of Electrically Active Impurities by Native Defects in IV-VI Semiconductors, Fiz. Tekh. Poluprovodn. (S.-Peterburg), 1994, vol. 28, no. 3, pp. 369-393.
    • (1994) Fiz. Tekh. Poluprovodn. , vol.28 , Issue.3 , pp. 369-393
    • Kaidanov, V.I.1    Nemov, S.A.2    Ravich, Yu.I.3
  • 9
    • 0036427901 scopus 로고    scopus 로고
    • Modified Hot-Wall Growth of Ga-Doped PbTe Films on Si Substrates
    • Ugai, Ya.A., Samoilov, A.M., Sharov, M.K., et al., Modified Hot-Wall Growth of Ga-Doped PbTe Films on Si Substrates, Poverkhnost, 2002, no. 3, pp. 28-36.
    • (2002) Poverkhnost , Issue.3 , pp. 28-36
    • Ugai, Ya.A.1    Samoilov, A.M.2    Sharov, M.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.