Measurements of the minimum elevation of nano-particles by 3D nanoscale tracking using ratiometric evanescent wave imaging

Experiments in Fluids

Volumn 41, Issue 2, 2006, Pages 173-183

  Margraves, C H ^a   Choi, C K ^a   Kihm, K D ^a  

^a University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); FLUORESCENCE; GLASS; MICROSCOPIC EXAMINATION; POLYSTYRENES; SUBSTRATES;

FLUORESCENCE EMISSIONS; RATIOMETRIC EVANESCENT WAVE IMAGING; RATIOMETRIC TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY (R-TIRFM); SALINE CONCENTRATION;

NANOSTRUCTURED MATERIALS;

CONCENTRATION (PROCESS); FLUORESCENCE; GLASS; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; POLYSTYRENES; SUBSTRATES;

EID: 33746797737     PISSN: 07234864     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00348-006-0151-8     Document Type: Conference Paper

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