Optical properties of solution-chemically derived thin film Ni-Al 2O3 composites and Si, Al and Si-Ti oxides

Journal of Physics Condensed Matter

Volumn 18, Issue 32, 2006, Pages 7737-7750

  Boström, Tobias K ^a   Wäckelgård, Ewa ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; METALLIC MATRIX COMPOSITES; OPTICAL PROPERTIES; REFRACTIVE INDEX; SILICA; SOLAR ABSORBERS; THIN FILMS; TITANIUM OXIDES;

SOLAR THERMAL USAGE; SOLUTION-CHEMICALLY DERIVED THIN FILM; TRANSMITTANCE MEASUREMENTS; WAVELENGTH RANGE;

NICKEL COMPOUNDS;

EID: 33746775347     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/32/021     Document Type: Article

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