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Volumn 2005, Issue , 2005, Pages 81-82
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Efficiency degradation due to carrier build-up in the broadened waveguides of high-power laser diodes: Analytical theory and numerical validation
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
COMPUTER SIMULATION;
ELECTRONICS PACKAGING;
QUANTUM EFFICIENCY;
SEMICONDUCTOR LASERS;
FREE CARRIERS;
LARGE-CAVITY LASER DIODES;
NON-BROADENED WAVEGUIDES;
OPTICAL CONFINEMENT;
OPTICAL WAVEGUIDES;
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EID: 33746760468
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/NUSOD.2005.1518145 Document Type: Conference Paper |
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Times cited : (5)
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References (4)
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