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Volumn 43, Issue 7, 2006, Pages 816-818

Use of genetic algorithms to determine carriers mobilities and lifetimes in semiconductor detectors

Author keywords

Compound semiconductor detectors; Digital signal processing; Genetic algorithms; Lifetimes; Mobility; Signal waveform

Indexed keywords

COMPOUND SEMICONDUCTOR DETECTORS; LIFETIMES; MOBILITY; SIGNAL WAVEFORM;

EID: 33746658677     PISSN: 00223131     EISSN: 00223131     Source Type: Journal    
DOI: 10.3327/jnst.43.816     Document Type: Review
Times cited : (4)

References (7)
  • 3
    • 0032533077 scopus 로고    scopus 로고
    • Direct measurement of product of the electron mobility and mean free drift time of CdZnTe semiconductors using position sensitive single polarity charge sensing detectors
    • Z. He, G. F. Knoll, D. K. Wehe, "Direct measurement of product of the electron mobility and mean free drift time of CdZnTe semiconductors using position sensitive single polarity charge sensing detectors," J. Appl. Phys., 84[10], 5566 (1998).
    • (1998) J. Appl. Phys. , vol.84 , Issue.10 , pp. 5566
    • He, Z.1    Knoll, G.F.2    Wehe, D.K.3
  • 4
    • 0031621950 scopus 로고    scopus 로고
    • Use of a Monte-Carlo code to determine in high Z semi-conductor CdTe and CZT, both carriers lifetimes and mobilities
    • E. Muller, M. Jung, P. Fougeres, M. Hage-Ali, P. Siffert, "Use of a Monte-Carlo code to determine in high Z semi-conductor CdTe and CZT, both carriers lifetimes and mobilities," Mater. Res. Soc. Symp. Proc., 487, 301 (1998).
    • (1998) Mater. Res. Soc. Symp. Proc. , vol.487 , pp. 301
    • Muller, E.1    Jung, M.2    Fougeres, P.3    Hage-Ali, M.4    Siffert, P.5
  • 7
    • 0036478376 scopus 로고    scopus 로고
    • Application of genetic algorithms to the charge loss correction in CdZnTe semiconductor detectors
    • N. Shaaban, H. Takahashi, S. Hasegawa, A. Suzuki, "Application of genetic algorithms to the charge loss correction in CdZnTe semiconductor detectors," Jpn. J. Appl. Phys., 41 [2A], 908 (2002).
    • (2002) Jpn. J. Appl. Phys. , vol.41 , Issue.2 A , pp. 908
    • Shaaban, N.1    Takahashi, H.2    Hasegawa, S.3    Suzuki, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.