Scaling of the coercive field with thickness in thin-film ferroelectrics

Ferroelectrics

Volumn 313, Issue , 2005, Pages 7-13

  Chandra, P ^a   Dawber, M ^b   Littlewood, P B ^c   Scott, J F ^b  

^a RUTGERS UNIVERSITY   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Coercive field; Thickness scaling; Thin film ferroelectrics

Indexed keywords

COERCIVE FORCE; NUCLEATION; STATISTICAL METHODS; THICKNESS CONTROL;

COERCIVE FIELD; FIELD-DEPENDENCE; THICKNESS-SCALING;

FERROELECTRIC THIN FILMS;

EID: 33746647964     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490891157     Document Type: Conference Paper

References (23)

1. E. Fatuzzo and W. J. Merz, Ferroelectricity (North-Holland, Amsterdam, 1967).
2. J. F. Scott, Ferroelectric Memories (Springer-Verlag, Berlin, 2000).
3. M. Dawber, P. Chandra, P. B. Littlewood, and J. F. Scott, J. Phys. Cond. Matt. 15, L393 (2003).
4. W. Merz, J. Appl. Phys. 27, 938-943 (1954).
5. H. L. Stadler and P. J. Zachminidis, J. Appl. Phys. 29, 1285 (1958);
6. H. L. Stadler, J. Appl. Phys., ibid. 33, 3487-90 (1962);
7. H. L. Stadler and P. J. Zachminidis, J. Appl. Phys., ibid. 34, 3255-3260 (1963).
8. A. V. Bune, V. M. Fridkin, S. Ducharme, L. M. Blinov, S. P. Palto, A. V. Sorokin, S. G. Yudin, and A. Zlatkin, Nature 391, 874-877 (1998).
9. S. Ducharme, V. M. Fridkin, A. V. Bune, S. P. Palto, L. M. Blinov, Nn. Petukhova, and S. G. Yudin, Physical Review Letters 84, 175-178 (2000).
10. R. Landauer, J. Appl. Phys. 28, 227 (1957).
11. V. Janovec, Czech. J. Phys. 8, 3 (1958).
12. H. F. Kay and J. W. Dunn, Phil. Mag. 7, 2027-2034 (1962).
13. V. Ya. Shur, A. L. Gruverman, N. Yu. Ponomarev, E. L. Rumyantsev, and N. A. Tonkacheva, "Domain structure kinetics in ultrafast polarization switching in lead germanate." JETP Lett. 53, 615-619 (1991).
14. V. Ya. Shur, "Fast polarization reversal process: evolution of ferroelectric domain structure in thin films," in C. Paz de Araujo, J. F. Scott, and G. W. Taylor (eds.), Ferroelectric Thin Films: Synthesis and Basic Properties (Gordon and Breach, Amsterdam, 1996), 153-192.
15. C. S. Ganpule, A. L. Roytburd, V. Nagarajan, B. K. Hill, S. B. Ogale, E. D. Williams, R. Ramesh, and J. F. Scott, "Polarization relaxation kinetics and 180 degrees domain wall dynamics in ferroelectric thin films." Phys. Rev. B 65, 0141011-0141017 (2002).
16. P. B. Littlewood and P. Chandra, "Delayed nucleation at a weakly first-order transition." Phys. Rev. Lett. 57, 2415-2418 (1986).
17. P. Chandra, "Nucleation in the presence of long-range interactions." Phys. Rev. A 39, 3672-3681 (1989).
18. J. Zhang, Z. Yin, M.-S. Zhang, and J. R Scott, "Size-driven phase transition in stress-induced ferroelectric thin films." Solid State Comm. 118, 241-246 (2001).
19. Y. Ishibashi and H. Orihara, "A theory of D-E hysteresis loop-application of Avrami model." Integrated Ferroelectrics 9, 57-61 (1995).
20. J. F. Scott, Ferroelectric Memories (Springer-Verlag, Berlin, 2000), pp. 126-127.
21. 3 crystals," Jpn. J. Appl. Phys. 40, 6506 (2001).
22. H. M. Duiker, and P. D. Beale, "Grain-size effects in ferroelectric switching." Phys. Rev. B 41, 490-495 (1990).
23. M. Molotskii, A. Agronin, P. Urenski, M. Shvelbelman, G. Rosenman, and Y. Rosenwaks, Phys. Rev. Lett. 90, 1076011 (2003).