Excess coincidences of reflected and refracted x rays from a synchrotron-radiation beamline

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 74, Issue 1, 2006, Pages

  Ikonen, Erkki ^a   Yabashi, Makina ^b   Ishikawa, Tetsuya ^c  

^a AALTO UNIVERSITY   (Finland)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c RIKEN SPring 8 Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; MONOCHROMATORS; REFRACTION; SCATTERING; SILICON; WAVEFRONTS;

COINCIDENCE RATE; DETECTOR SIZES; FITTING FUNCTIONS; UNDULATOR BEAMLINE;

SYNCHROTRON RADIATION;

EID: 33746617412     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.74.013816     Document Type: Article

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