SCOPUS 정보 검색 플랫폼

Physical Review Letters

Volumn 88, Issue 24, 2002, Pages 2448011-2448014

Measurement of x-ray pulse widths by intensity interferometry

(3) Yabashi, M a Tamasaku, K b Ishikawa, T a,b

a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

b SPring 8/RIKEN ^* (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; INTERFEROMETRY; PROCEDURES; X RAY;

CALIBRATION; INTERFEROMETRY; X-RAYS;

AVALANCHE DIODES; BANDWIDTH; COHERENT LIGHT; FREE ELECTRON LASERS; INTERFEROMETRY; MONOCHROMATORS; PHOTODIODES; SCANNING; SECOND HARMONIC GENERATION; SPONTANEOUS EMISSION; STREAK CAMERAS; SYNCHROTRON RADIATION; ULTRAFAST PHENOMENA; X RAY DIFFRACTION;

DOUBLE CRYSTAL MONOCHROMATORS (DCM); X-RAY PULSE WIDTHS;

X RAYS;

EID: 17044452579 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.88.244801 Document Type: Article

Times cited : (43)

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