High capacity oxide/ferroelectric/oxide stacks for on-chip charge storage

Applied Physics Letters

Volumn 89, Issue 4, 2006, Pages

  Zhong, S ^a   Alpay, S P ^a   Mantese, J V ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b DELPHI CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL FRACTION; DIELECTRIC THICKNESS; LINEAR DIELECTRICS; SPONTANEOUS POLARIZATION;

DIELECTRIC MATERIALS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; PERMITTIVITY; POLARIZATION; SOLID SOLUTIONS; STRUCTURAL ANALYSIS;

SANDWICH STRUCTURES;

EID: 33746595366     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2236265     Document Type: Article

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