Piezoelectric coefficient of BiFe1 - x Mnx O3 thin films measured by piezoresponse force microscopy

Physica B: Condensed Matter

Volumn 383, Issue 1, 2006, Pages 31-32

  Lee, S H ^a   Yang, C H ^a   Jeong, Y H ^a   Birge, N O ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

BiFe1 x Mnx O3; PFM; Piezoelectric coefficient

Indexed keywords

BISMUTH COMPOUNDS; FILM GROWTH; PIEZOELECTRICITY; PULSED LASER DEPOSITION; SUBSTRATES; TEMPERATURE DISTRIBUTION;

BIFE1 - X MNX O3; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC HYSTERESIS; PIEZORESPONSE FORCE MICROSCOPY (PFM);

THIN FILMS;

EID: 33746572780     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.03.043     Document Type: Article

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