Direct determination of tellurium in geological samples by inductively coupled plasma mass spectrometry using ethanol as a matrix modifier

Applied Spectroscopy

Volumn 60, Issue 7, 2006, Pages 781-785

  Hu, Zhaochu ^a,b   Gao, Shan ^a,b   Günther, Detlef ^c   Hu, Shenghong ^a   Liu, Xiaoming ^b   Yuan, Honglin ^b  

^a CHINA UNIVERSITY OF GEOSCIENCES   (China)

^b NORTHWEST UNIVERSITY   (China)

^c ETH ZURICH   (Switzerland)

Author keywords

Ethanol; Geological samples; ICP MS; Inductively coupled plasma mass spectrometry; Tellurium; Xe interferences

Indexed keywords

ETHANOL; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; NANOSTRUCTURED MATERIALS; SENSITIVITY ANALYSIS; XENON;

GEOLOGICAL SAMPLES; ICP-MS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; XE INTERFERENCES;

TELLURIUM;

EID: 33746494968     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370206777887008     Document Type: Article

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