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Volumn 3, Issue , 2006, Pages 1725-1728

Surface segregation of Si and Mg dopants in MOVPE grown GaN films revealed by X-ray photoemission spectro-microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AR ION SPUTTERING; DOPANTS; SEGREGATION TENDENCY; SURFACE SEGREGATION; 64.75.+G; 68.55.LN; 81.15.KK; 82.80.EJ; SURFACE ENRICHMENT; THREE-FOLD SYMMETRY; X RAY PHOTOEMISSION SPECTROSCOPY; X-RAY PHOTOEMISSIONS;

EID: 33746429548     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200565437     Document Type: Conference Paper
Times cited : (6)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.