X-ray characterization of nanostructured materials

Defect and Diffusion Forum

Volumn 208-209, Issue , 2002, Pages 187-200

  Pielaszek, Roman ^a   Gierlotka, Stanislaw ^a   Stelmakh, Svetlana ^a   Grzanka, Ewa ^a   Palosz, Bogdan ^a  

^a INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

Computer Simulation; Grain Size Distribution; Nanomaterials; Stacking Faults; X Ray Powder Diffraction

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; GENETIC ALGORITHMS; SENSITIVITY ANALYSIS; STACKING FAULTS; STRAIN; X RAY POWDER DIFFRACTION;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 18844481806     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.208-209.187     Document Type: Conference Paper

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5. D.G. Keil, H.F. Calcote, R.J. Gill, MRS Symp.Proc. 410 (1996) 167.