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Volumn 105, Issue 2, 2006, Pages 73-77

Structural characterisation of crystalline carbon nitride thin films synthesised by electrolysis of urea-methanol solution

Author keywords

Carbon nitride; Crystalline phase; Electrodeposition; FTIR; Selected area electron diffraction; Transmission electron microscopy

Indexed keywords

ATMOSPHERIC PRESSURE; ATMOSPHERIC TEMPERATURE; CARBON NITRIDE; COATED MATERIALS; ELECTROLYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

EID: 33746376560     PISSN: 17436753     EISSN: 17436761     Source Type: Journal    
DOI: 10.1179/174367606X100324     Document Type: Article
Times cited : (6)

References (8)
  • 8
    • 0003443049 scopus 로고
    • 'Optical processes in semiconductors'
    • Englewood Cliffs, NJ, Prentice-Hall
    • J. I. Pankove: 'Optical processes in semiconductors', 34-36; 1971, Englewood Cliffs, NJ, Prentice-Hall.
    • (1971) , pp. 34-36
    • Pankove, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.